FWF - SIRENS - Studien zu ionisierenden Strahlungseffekten in NanoScale CMOS

Physik & Astronomy

1. CMOS 100%
2. dosage 95%
3. transistors 76%
4. radiation effects 68%
5. ionizing radiation 61%
6. trapping 43%
7. field effect transistors 42%
8. radiation 42%
9. leakage 35%
10. scaling 31%
11. spacers 30%
12. integrated circuits 30%
13. halos 26%
14. traps 23%
15. damage 22%
16. x rays 21%
17. foundries 20%
18. permittivity 20%
19. annealing 17%
20. research projects 16%
21. silicon oxides 16%
22. application specific integrated circuits 16%
23. geometry 16%
24. fabrication 16%
25. radiation damage 16%
26. semiconductor devices 16%
27. photolithography 15%
28. materials science 14%
29. energy distribution 14%
30. spatial distribution 14%
31. examination 13%
32. implantation 12%
33. gamma rays 11%
34. silicon dioxide 10%
35. high speed 10%
36. wafers 10%
37. insulators 10%
38. causes 9%
39. electric fields 9%
40. defects 8%
41. characterization 7%
42. profiles 7%
43. performance 6%
44. electrons 5%