3D-Nanoprinting of Magnetic Force Microscopy Tips

Magnetic Force Microscopy (MFM), an advanced mode of Atomic Force Microscopy (AFM), is an often usedand very powerful characterization technology. To induce the magnetic sensitivity, commercial MFM cantilevers mostlyuse non-magnetic standard tips, which are covered with thin magnetic coatings. Such additional layers, however,increase the apex radii, which consequently reduce the lateral resolution capabilities in both, AFM and MFM scans.Furthermore, mechanical stress during scanning can lead to local delamination of the magnetic coating, whichchanges or even removes the magnetic sensitivity. To overcome those issues, a solid, fully magnetic nanoscale tipwould be required, which can be a tough challenge when aiming on full cantilever chips. Following that motivation,we here demonstrate the application of Focused Electron Beam Induced Deposition (FEBID) for additive, direct-write3D-nanoprinting of magnetic tips on pre-finished AFM cantilevers