3D-Nanoprinting of Magnetic Force Microscopy Tips

Michele Brugger-Hatzl, Robert Winkler, Harald Plank, Stefan Mitsche, Thomas Radlinger, Michael Huth, Sven Barth, Harald Plank

Publikation: KonferenzbeitragAbstract


Magnetic Force Microscopy (MFM), an advanced mode of Atomic Force Microscopy (AFM), is an often usedand very powerful characterization technology. To induce the magnetic sensitivity, commercial MFM cantilevers mostlyuse non-magnetic standard tips, which are covered with thin magnetic coatings. Such additional layers, however,increase the apex radii, which consequently reduce the lateral resolution capabilities in both, AFM and MFM scans.Furthermore, mechanical stress during scanning can lead to local delamination of the magnetic coating, whichchanges or even removes the magnetic sensitivity. To overcome those issues, a solid, fully magnetic nanoscale tipwould be required, which can be a tough challenge when aiming on full cantilever chips. Following that motivation,we here demonstrate the application of Focused Electron Beam Induced Deposition (FEBID) for additive, direct-write3D-nanoprinting of magnetic tips on pre-finished AFM cantilevers
PublikationsstatusVeröffentlicht - 2022
Veranstaltung8th FEBIP Workshop of the Focused-Electron-Beam-Induced-Processing: FEBIP 2022 - Krakow, Krakow, Polen
Dauer: 12 Juli 202215 Juli 2022


Konferenz8th FEBIP Workshop of the Focused-Electron-Beam-Induced-Processing
KurztitelFEBIP 2022

ASJC Scopus subject areas

  • Allgemeine Materialwissenschaften

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

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