A Differential-Mode and Common-Mode DC-Bias VNA Measurement Setup for Power 4-Port Devices

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem KonferenzbandBegutachtung

Abstract

A measurement setup for 4-port power electronic components is presented. The setup allows for the devices under test (DUT) to be DC-biased up to 10 A. The usable frequency range of the setup is from 50 kHz to 1 GHz. The usable frequency range can be extended down to 9 kHz (in compliance with CISPR 16-2-1) by using suitable bias tees, with otherwise no changes to the measurement setup. Therefore this work serves as a proof-of-concept for the measurement setup. S-parameter measurements of a common mode choke (CMC) are presented. Measurements with the proposed setup are compared to a reference measurement without the bias tees. These measurement results show that the influence of the bias tees is negligible, as was intended. Furthermore measurement results of the CMC under DC bias conditions are presented. A possible conversion of the S-parameters to the series impedance of the CMC is also shown to illustrate the possible applications of this measurement method.
Originalspracheenglisch
Titel2024 International Symposium on Electromagnetic Compatibility – EMC Europe
Herausgeber (Verlag)IEEE Publications
Seiten1076-1081
Seitenumfang6
Auflage2024
ISBN (elektronisch)979-8-3503-0735-1
DOIs
PublikationsstatusVeröffentlicht - 2 Sept. 2024
Veranstaltung2024 International Symposium on Electromagnetic Compatibility, EMC Europe 2024 - Bruges, Belgien
Dauer: 2 Sept. 20245 Sept. 2024

Publikationsreihe

NameProceedings of the International Symposium on Electromagnetic Compatibility, EMC Europe
ISSN (Print)2325-0356

Konferenz

Konferenz2024 International Symposium on Electromagnetic Compatibility, EMC Europe 2024
KurztitelEMC Europe 2024
Land/GebietBelgien
OrtBruges
Zeitraum2/09/245/09/24

ASJC Scopus subject areas

  • Elektrotechnik und Elektronik

Fields of Expertise

  • Information, Communication & Computing

Treatment code (Nähere Zuordnung)

  • Application

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