A disordered layered phase in thin films of sexithiophene

Armin Moser*, Ingo Salzmann, Martin Oehzelt, Alfred Neuhold, Heinz-Georg Flesch, Jan Ivanco, Sergiu Pop, Teodor Toader, Dietrich R.T. Zahn, Detlef-Matthias Smilgies, Roland Resel*

*Korrespondierende/r Autor/-in für diese Arbeit

Publikation: Beitrag in einer FachzeitschriftArtikelBegutachtung

Abstract

This Letter reports the impact of the evaporation rate on the crystallographic phase formation of vacuum deposited α-sexithiophene thin films studied by X-ray diffraction methods. The experiments reveal the formation of two crystal phases, one of which is a thermodynamically stable phase occurring at low rates, while the second is favored by high rates. This second phase exhibits an increased layer spacing and diffraction features typical for two-dimensional crystals which are laterally ordered but without interlayer correlations of the molecular positions. This disordered layered phase comprises molecules of nonuniform conformations, and is kinetically induced.
Originalspracheenglisch
Seiten (von - bis)51-55
FachzeitschriftChemical Physics Letters
Jahrgang574
DOIs
PublikationsstatusVeröffentlicht - 2013

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

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