At-line validation of optical coherence tomography as in-line/at-line coating thickness measurement method

Matthias Wolfgang; Anna Peter; Patrick Wahl; Daniel Markl; J. Axel Zeitler; Johannes G. Khinast

doi:10.1016/j.ijpharm.2019.118766

At-line validation of optical coherence tomography as in-line/at-line coating thickness measurement method

Matthias Wolfgang, Anna Peter, Patrick Wahl, Daniel Markl, J. Axel Zeitler, Johannes G. Khinast

Publikation: Beitrag in einer Fachzeitschrift › Artikel › Begutachtung

Originalsprache	englisch
Fachzeitschrift	International Journal of Pharmaceutics
Jahrgang	572
DOIs	https://doi.org/10.1016/j.ijpharm.2019.118766
Publikationsstatus	Veröffentlicht - 15 Dez. 2019

Zugriff auf Dokument

10.1016/j.ijpharm.2019.118766

Dieses zitieren

@article{54f92a25cf854fb1b5a9f06783dcef09,

title = "At-line validation of optical coherence tomography as in-line/at-line coating thickness measurement method",

keywords = "Optical coherence tomography (OCT), Terahertz pulsed imaging (TPI), X-ray micro computed tomography (X mu CT), Reference material, Coating thickness variability",

author = "Matthias Wolfgang and Anna Peter and Patrick Wahl and Daniel Markl and Zeitler, {J. Axel} and Khinast, {Johannes G.}",

year = "2019",

month = dec,

day = "15",

doi = "10.1016/j.ijpharm.2019.118766",

language = "English",

volume = "572",

journal = "International Journal of Pharmaceutics",

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TY - JOUR

T1 - At-line validation of optical coherence tomography as in-line/at-line coating thickness measurement method

AU - Wolfgang, Matthias

AU - Peter, Anna

AU - Wahl, Patrick

AU - Markl, Daniel

AU - Zeitler, J. Axel

AU - Khinast, Johannes G.

PY - 2019/12/15

Y1 - 2019/12/15

KW - Optical coherence tomography (OCT)

KW - Terahertz pulsed imaging (TPI)

KW - X-ray micro computed tomography (X mu CT)

KW - Reference material

KW - Coating thickness variability

U2 - 10.1016/j.ijpharm.2019.118766

DO - 10.1016/j.ijpharm.2019.118766

M3 - Article

SN - 0378-5173

VL - 572

JO - International Journal of Pharmaceutics

JF - International Journal of Pharmaceutics

ER -