Broadband 3D Modeling and Simulation of DC-Biased SMT Ferrite Beads for EMI Filters

Christian Riener*, Thomas Bauernfeind, Klaus Roppert, Samuel Kvasnicka, Bernhard Auinger, Manfred Kaltenbacher

*Korrespondierende/r Autor/-in für diese Arbeit

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem KonferenzbandBegutachtung

Abstract

Electromagnetic interference (EMI) within electronic based systems (EBS) became a fundamental issue that requires dedicated countermeasures e.g. filter structures to avoid unintended system behavior. The sefilters comprise several components including surface-mounted(SMT) devices to suppress unwanted electromagnetic emissions. However, these devices change their behavior due to dispersion-and saturation-effects (ferroelectric-and ferromagnetic-effect), hence applying a DC bias current might lead to a significantly different behavior than intended. The presented methodology allows a broadband characterization of ferrite core materials used in SMT ferrite bead to predict the impact of dispersion-and saturation-effects on impedance behavior of device. The proposed modeling strategy is based on the Kramers-Kronig relation, vector network analyzer (VNA) measurements, and full-wave finite element simulations.The Extracted Material Models are validated for a frequency range from 100 kHz - 1 GHz and DC bias current levels up to 5A.

Originalspracheenglisch
Titel2023 International Symposium on Electromagnetic Compatibility - EMC Europe
Herausgeber (Verlag)IEEE
ISBN (elektronisch)9798350324006
DOIs
PublikationsstatusVeröffentlicht - 2023
Veranstaltung2023 International Symposium and Exhibition on Electromagnetic Compatibility: EMC Europe 2023 - Kraków, Polen
Dauer: 4 Sept. 20238 Sept. 2023

Konferenz

Konferenz2023 International Symposium and Exhibition on Electromagnetic Compatibility
KurztitelEMC Europe 2023
Land/GebietPolen
OrtKraków
Zeitraum4/09/238/09/23

ASJC Scopus subject areas

  • Physik der kondensierten Materie
  • Elektrotechnik und Elektronik

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