Challenges Resulting from the Use of Spark Gaps for Superimposed Voltage Tests

Oliver Pischler; Uwe Schichler

Challenges Resulting from the Use of Spark Gaps for Superimposed Voltage Tests

Publikation: Konferenzbeitrag › Paper › Begutachtung

Originalsprache	englisch
Publikationsstatus	Veröffentlicht - 21 Mai 2018
Veranstaltung	12th International Conference on the Properties and Applications of Dielectric Materials - Xi'an, China Dauer: 20 Mai 2018 → 24 Mai 2018 http://www.icpadm2018.org/

Konferenz

Konferenz	12th International Conference on the Properties and Applications of Dielectric Materials
Kurztitel	ICPADM 2018
Land/Gebiet	China
Ort	Xi'an
Zeitraum	20/05/18 → 24/05/18
Internetadresse	http://www.icpadm2018.org/

Dieses zitieren

@conference{7d7ec74db4d645b980d0e125dcb32fba,

title = "Challenges Resulting from the Use of Spark Gaps for Superimposed Voltage Tests",

author = "Oliver Pischler and Uwe Schichler",

year = "2018",

month = may,

day = "21",

language = "English",

note = "12th International Conference on the Properties and Applications of Dielectric Materials, ICPADM 2018, ICPADM 2018 ; Conference date: 20-05-2018 Through 24-05-2018",

url = "http://www.icpadm2018.org/",

}