Characterization and Handling of Low-Cost Micro-Architectural Signatures in MPSoCs

Armin Krieg; Johannes Grinschgl; Christian Steger; Reinhold Weiß; Andreas Genser; Holger Bock; Josef Haid

Characterization and Handling of Low-Cost Micro-Architectural Signatures in MPSoCs

Armin Krieg, Johannes Grinschgl, Christian Steger, Reinhold Weiß, Andreas Genser, Holger Bock, Josef Haid

Institut für Technische Informatik (4480)

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Originalsprache	englisch
Titel	17th IEEE European Test Symposium (ETS)
Herausgeber (Verlag)	.
Seiten	62-67
ISBN (Print)	978-1-4673-0697-3
Publikationsstatus	Veröffentlicht - 2012
Veranstaltung	17th IEEE European Test Symposium (ETS) - , Frankreich Dauer: 28 Mai 2012 → 1 Juni 2012

Konferenz

Konferenz	17th IEEE European Test Symposium (ETS)
Land/Gebiet	Frankreich
Zeitraum	28/05/12 → 1/06/12

Fields of Expertise

Information, Communication & Computing

Treatment code (Nähere Zuordnung)

Application
Experimental

PowerModes - POWer EmulatoR and MOdel based DEpendability and Security evaluation platform
Krieg, A., Grinschgl, J. & Steger, C.
1/05/10 → 31/10/12
Projekt: Forschungsprojekt

Dieses zitieren

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title = "Characterization and Handling of Low-Cost Micro-Architectural Signatures in MPSoCs",

author = "Armin Krieg and Johannes Grinschgl and Christian Steger and Reinhold Wei{\ss} and Andreas Genser and Holger Bock and Josef Haid",

year = "2012",

language = "English",

isbn = "978-1-4673-0697-3",

pages = "62--67",

booktitle = "17th IEEE European Test Symposium (ETS)",

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note = "17th IEEE European Test Symposium (ETS) ; Conference date: 28-05-2012 Through 01-06-2012",

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TY - GEN

T1 - Characterization and Handling of Low-Cost Micro-Architectural Signatures in MPSoCs

AU - Krieg, Armin

AU - Grinschgl, Johannes

AU - Steger, Christian

AU - Weiß, Reinhold

AU - Genser, Andreas

AU - Bock, Holger

AU - Haid, Josef

PY - 2012

Y1 - 2012

M3 - Conference paper

SN - 978-1-4673-0697-3

SP - 62

EP - 67

BT - 17th IEEE European Test Symposium (ETS)

PB - .

T2 - 17th IEEE European Test Symposium (ETS)

Y2 - 28 May 2012 through 1 June 2012

ER -

Characterization and Handling of Low-Cost Micro-Architectural Signatures in MPSoCs

Konferenz

Fields of Expertise

Treatment code (Nähere Zuordnung)

Projekte

PowerModes - POWer EmulatoR and MOdel based DEpendability and Security evaluation platform

Dieses zitieren