Combined XPS, AFM, TEM and ellipsometric studies on nanoscale layers in organic light emitting diodes

Stefan Muellegger; Franz Wenzel; Georg Jakopic; Markus Wuchse; Norbert Koch; Anja Haase; K Lamprecht; M Mitterbauer; F Hofer; Christian Suess; Günther Leising; M. Schatzmayr

doi:10.1016/S0039-6028(02)01288-8

Combined XPS, AFM, TEM and ellipsometric studies on nanoscale layers in organic light emitting diodes

Stefan Muellegger, Franz Wenzel, Georg Jakopic, Markus Wuchse, Norbert Koch, Anja Haase, K Lamprecht, M Mitterbauer, F Hofer, Christian Suess, Günther Leising, M. Schatzmayr

Institut für Festkörperphysik (5130)

Publikation: Beitrag in einer Fachzeitschrift › Artikel › Begutachtung

Originalsprache	englisch
Seiten (von - bis)	473-479
Fachzeitschrift	Surface Science
Jahrgang	507-510
DOIs	https://doi.org/10.1016/S0039-6028(02)01288-8
Publikationsstatus	Veröffentlicht - 2002

Zugriff auf Dokument

10.1016/S0039-6028(02)01288-8

Dieses zitieren

@article{bff91b5cf4944ad19503b1e180ca622c,

title = "Combined XPS, AFM, TEM and ellipsometric studies on nanoscale layers in organic light emitting diodes",

author = "Stefan Muellegger and Franz Wenzel and Georg Jakopic and Markus Wuchse and Norbert Koch and Anja Haase and K Lamprecht and M Mitterbauer and F Hofer and Christian Suess and G{\"u}nther Leising and M. Schatzmayr",

year = "2002",

doi = "10.1016/S0039-6028(02)01288-8",

language = "English",

volume = "507-510",

pages = "473--479",

journal = "Surface Science",

issn = "1879-2758",

publisher = "Elsevier B.V.",

}

TY - JOUR

T1 - Combined XPS, AFM, TEM and ellipsometric studies on nanoscale layers in organic light emitting diodes

AU - Muellegger, Stefan

AU - Wenzel, Franz

AU - Jakopic, Georg

AU - Wuchse, Markus

AU - Koch, Norbert

AU - Haase, Anja

AU - Lamprecht, K

AU - Mitterbauer, M

AU - Hofer, F

AU - Suess, Christian

AU - Leising, Günther

AU - Schatzmayr, M.

PY - 2002

Y1 - 2002

U2 - 10.1016/S0039-6028(02)01288-8

DO - 10.1016/S0039-6028(02)01288-8

M3 - Article

SN - 1879-2758

VL - 507-510

SP - 473

EP - 479

JO - Surface Science

JF - Surface Science

ER -