@inproceedings{517b5f209b7c46928dbb5b621d40ead1,
title = "Darstellung der TEM-Zellen und der Surface Scan Messmethode zur Untersuchung des Einflusses von On-Chip Decoupling Kapazit{\"a}ten auf die St{\"o}remission von Integrierten Schaltungen",
author = "Timm Ostermann and Bernd Deutschmann and D. Schneider and R. Jungreithmair",
year = "2003",
language = "deutsch",
pages = "66--69",
booktitle = "ITG-Workshop Testmethods and Reliability of Circuits and Systems",
publisher = ".",
note = "ITG-Workshop Testmethods and Reliability of Circuits and Systems ; Conference date: 23-03-2003 Through 25-03-2003",
}