Defect characterization of highly emissive para-phenylene-type molecular films by photoluminescence-detected magnetic resonance and thermally stimulated charge transport

Emil List; C.-H. Kim; J. Shinar; Alexander Pogantsch; K. Petritsch; Günther Leising; W. Graupner

Defect characterization of highly emissive para-phenylene-type molecular films by photoluminescence-detected magnetic resonance and thermally stimulated charge transport

Emil List, C.-H. Kim, J. Shinar, Alexander Pogantsch, K. Petritsch, Günther Leising, W. Graupner

Institut für Festkörperphysik (5130)

Publikation: Beitrag in einer Fachzeitschrift › Artikel › Begutachtung

Originalsprache	englisch
Seiten (von - bis)	81-85
Fachzeitschrift	Synthetic Metals
Jahrgang	116
Ausgabenummer	1-3
Publikationsstatus	Veröffentlicht - 2001

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title = "Defect characterization of highly emissive para-phenylene-type molecular films by photoluminescence-detected magnetic resonance and thermally stimulated charge transport",

author = "Emil List and C.-H. Kim and J. Shinar and Alexander Pogantsch and K. Petritsch and G{\"u}nther Leising and W. Graupner",

year = "2001",

language = "English",

volume = "116",

pages = "81--85",

journal = "Synthetic Metals",

issn = "1879-3290",

publisher = "Elsevier B.V.",

number = "1-3",

}

TY - JOUR

T1 - Defect characterization of highly emissive para-phenylene-type molecular films by photoluminescence-detected magnetic resonance and thermally stimulated charge transport

AU - List, Emil

AU - Kim, C.-H.

AU - Shinar, J.

AU - Pogantsch, Alexander

AU - Petritsch, K.

AU - Leising, Günther

AU - Graupner, W.

PY - 2001

Y1 - 2001

M3 - Article

SN - 1879-3290

VL - 116

SP - 81

EP - 85

JO - Synthetic Metals

JF - Synthetic Metals

IS - 1-3

ER -