Determination of crystallite size and lattice strain in hexaphenyl thin films by line profile analysis

H. - J. Brandt, Roland Resel, J. Keckes, B. Koppelhuber-Bitschnau, N. Koch, Günther Leising

Publikation: Beitrag in einer Fachzeitschrift › Artikel

Originalsprache	englisch
Seiten (von - bis)	161-166
Fachzeitschrift	Materials Research Society Symposium Proceedings
Jahrgang	561
Publikationsstatus	Veröffentlicht - 1999

Treatment code (Nähere Zuordnung)

@article{3e97bbd7e06048238522b10e2ea33349,

title = "Determination of crystallite size and lattice strain in hexaphenyl thin films by line profile analysis",

author = "Brandt, {H. - J.} and Roland Resel and J. Keckes and B. Koppelhuber-Bitschnau and N. Koch and G{\"u}nther Leising",

year = "1999",

language = "English",

volume = "561",

pages = "161--166",

journal = "Materials Research Society Symposium Proceedings",

issn = "1946-4274 ",

publisher = "Materials Research Society",

}

TY - JOUR

T1 - Determination of crystallite size and lattice strain in hexaphenyl thin films by line profile analysis

AU - Brandt, H. - J.

AU - Resel, Roland

AU - Keckes, J.

AU - Koppelhuber-Bitschnau, B.

AU - Koch, N.

AU - Leising, Günther

PY - 1999

Y1 - 1999

M3 - Article

SN - 1946-4274

VL - 561

SP - 161

EP - 166

JO - Materials Research Society Symposium Proceedings

JF - Materials Research Society Symposium Proceedings

ER -