ESD protection characterization by an extended Wunsch-Bell plot

Patrick Schrey

Publikation: KonferenzbeitragPaperBegutachtung

Abstract

Extensive knowledge of the protection device's behavior under electrostatic discharge stress is mandatory to characterize protective elements and systems. This paper gives a brief overview on different electrostatic discharge protection concepts, including general considerations on diverting stress, trigger mechanisms, and their limitations. The protection approaches have to be selected in conjunction with the operational signals to avoid malfunction, increased power consumption, or physical failure. The Wunsch-Bell model is extended by means of an additional axis incorporating the rise time to better characterize different protective circuitry from component- to system-level. This allows for more accurate prediction of system robustness possibly preventing costly re-designs.
Originalspracheenglisch
DOIs
PublikationsstatusVeröffentlicht - 27 Juni 2016
Veranstaltung12th Conference on Ph.D. Research in Microelectronics and Electronics: PRIME 2016 - Lissabon, Portugal
Dauer: 27 Juni 201630 Juni 2016

Konferenz

Konferenz12th Conference on Ph.D. Research in Microelectronics and Electronics
KurztitelPRIME 2016
Land/GebietPortugal
OrtLissabon
Zeitraum27/06/1630/06/16

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