Exploring the effects of graphene and temperature in reducing electron beam damage: A TEM and electron diffraction-based quantitative study on Lead Phthalocyanine (PbPc) crystals

Noopur Jain, Yansong Hao, Urvi Parekh, Martin Kaltenegger, Adrián Pedrazo-Tardajos, Roberto Lazzaroni, Roland Resel, Yves Henri Geerts, Sara Bals*, Sandra Van Aert

*Korrespondierende/r Autor/-in für diese Arbeit

Publikation: Beitrag in einer FachzeitschriftArtikelBegutachtung

Abstract

High-resolution transmission electron microscopy (TEM) of organic crystals, such as Lead Phthalocyanine (PbPc), is very challenging since these materials are prone to electron beam damage leading to the breakdown of the crystal structure during investigation. Quantification of the damage is imperative to enable high-resolution imaging of PbPc crystals with minimum structural changes. In this work, we performed a detailed electron diffraction study to quantitatively measure degradation of PbPc crystals upon electron beam irradiation. Our study is based on the quantification of the fading intensity of the spots in the electron diffraction patterns. At various incident dose rates (e/Å2/s) and acceleration voltages, we experimentally extracted the decay rate (1/s), which directly correlates with the rate of beam damage. In this manner, a value for the critical dose (e/Å2) could be determined, which can be used as a measure to quantify beam damage. Using the same methodology, we explored the influence of cryogenic temperatures, graphene TEM substrates, and graphene encapsulation in prolonging the lifetime of the PbPc crystal structure during TEM investigation. The knowledge obtained by diffraction experiments is then translated to real space high-resolution TEM imaging of PbPc.

Originalspracheenglisch
Aufsatznummer103444
FachzeitschriftMicron
Jahrgang169
DOIs
PublikationsstatusVeröffentlicht - Juni 2023

ASJC Scopus subject areas

  • Strukturelle Biologie
  • Werkstoffwissenschaften (insg.)
  • Physik und Astronomie (insg.)
  • Zellbiologie

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