External and Intrinsic Plagiarism Detection Using Vector Space Models

Markus Muhr; Mario Zechner; Roman Kern; Michael Granitzer

External and Intrinsic Plagiarism Detection Using Vector Space Models

Markus Muhr, Mario Zechner, Roman Kern, Michael Granitzer

Know-Center GmbH Research Center for Data-Driven Business & Big Data Analytics (98770)

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Originalsprache	englisch
Titel	Proceedings of the SEPLN'09 Workshop on Uncovering Plagiarism, Authorship and Social Software Misuse (PAN-2009) and 1st International Competition on Plagiarism Detection
Herausgeber (Verlag)	.
Seiten	47-47
Publikationsstatus	Veröffentlicht - 2009

Andere Dateien und Links

http://ftp1.de.freebsd.org/Publications/CEUR-WS/Vol-502/pan09-proceedings.pdf#page=55

Dieses zitieren

External and Intrinsic Plagiarism Detection Using Vector Space Models. / Muhr, Markus; Zechner, Mario; Kern, Roman et al.
Proceedings of the SEPLN'09 Workshop on Uncovering Plagiarism, Authorship and Social Software Misuse (PAN-2009) and 1st International Competition on Plagiarism Detection. ., 2009. S. 47-47.

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

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BT - Proceedings of the SEPLN'09 Workshop on Uncovering Plagiarism, Authorship and Social Software Misuse (PAN-2009) and 1st International Competition on Plagiarism Detection

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