Extraction of dispersive material parameters using vector network analyzers and genetic algorithms

JM Zhang, Marina Y. Koledintseva, DP Pommerenke, James L. Drewniak, Konstantin N. Rozanov, G Antonini, A Orlandi

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem KonferenzbandBegutachtung

Abstract

A novel method to extract dispersive properties for dielectrics over a wide frequency range is proposed. This method is based on measuring scattering parameters for planar transmission lines and applying genetic algorithms. The scattering parameters are converted into ABCD matrix parameters. The complex propagation constant of the TEM wave inside the line is obtained from A-parameters of the ABCD matrix. For planar transmission lines, analytical or empirical formulas for dielectric loss, conductor loss, and phase constant are known. The genetic algorithm is then used to extract the Debye parameters for the dielectric substrates. FDTD modeling is used to verify the dispersive parameter extraction by comparing with the measurement
Originalspracheenglisch
Titel2006 IEEE Instrumentation and Measurement Technology Conference Proceedings
Seiten462-467
ISBN (elektronisch)0780393600, 978-078039360-8
DOIs
PublikationsstatusVeröffentlicht - 1 Jan. 2006
Extern publiziertJa
Veranstaltung23rd IEEE International Instrumentation and Measurement Technology Conference: IMTC 2006 - Sorrento, Italien
Dauer: 24 Apr. 200627 Apr. 2006

Konferenz

Konferenz23rd IEEE International Instrumentation and Measurement Technology Conference
KurztitelI2MTC 2006
Land/GebietItalien
OrtSorrento
Zeitraum24/04/0627/04/06

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