FEM-based Computation of circuit parameters for testing fast transients for EMC problems

Susanne Bauer; Werner Renhart; Oszkar Biro

doi:10.1109/CEFC.2016.7816252

FEM-based Computation of circuit parameters for testing fast transients for EMC problems

Susanne Bauer, Werner Renhart, Oszkar Biro

Institut für Grundlagen und Theorie der Elektrotechnik (4370)

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Abstract

This contribution outlines the extraction of circuit parameters with 3D finite elements from the standardized electromagnetic compatibility (EMC) measurement setup of the capacitive coupling clamp that is utilized for immunity tests against fast transients.

Originalsprache	englisch
Titel	IEEE CEFC 2016 - 17th Biennial Conference on Electromagnetic Field Computation
Herausgeber (Verlag)	Institute of Electrical and Electronics Engineers
ISBN (elektronisch)	9781509010325
DOIs	https://doi.org/10.1109/CEFC.2016.7816252
Publikationsstatus	Veröffentlicht - 12 Jan. 2017
Veranstaltung	17th Biennial IEEE Conference on Electromagnetic Field Computation, IEEE CEFC 2016 - Miami, USA / Vereinigte Staaten Dauer: 13 Nov. 2016 → 16 Nov. 2016

Konferenz

Konferenz	17th Biennial IEEE Conference on Electromagnetic Field Computation, IEEE CEFC 2016
Land/Gebiet	USA / Vereinigte Staaten
Ort	Miami
Zeitraum	13/11/16 → 16/11/16

ASJC Scopus subject areas

Computational Mathematics
Instrumentierung
Elektrotechnik und Elektronik

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10.1109/CEFC.2016.7816252

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FEM-based Computation of circuit parameters for testing fast transients for EMC problems. / Bauer, Susanne; Renhart, Werner ; Biro, Oszkar.
IEEE CEFC 2016 - 17th Biennial Conference on Electromagnetic Field Computation. Institute of Electrical and Electronics Engineers, 2017. 7816252.

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Bauer, S, Renhart, W & Biro, O 2017, FEM-based Computation of circuit parameters for testing fast transients for EMC problems. in IEEE CEFC 2016 - 17th Biennial Conference on Electromagnetic Field Computation., 7816252, Institute of Electrical and Electronics Engineers, 17th Biennial IEEE Conference on Electromagnetic Field Computation, IEEE CEFC 2016, Miami, USA / Vereinigte Staaten, 13/11/16. https://doi.org/10.1109/CEFC.2016.7816252

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title = "FEM-based Computation of circuit parameters for testing fast transients for EMC problems",

abstract = "This contribution outlines the extraction of circuit parameters with 3D finite elements from the standardized electromagnetic compatibility (EMC) measurement setup of the capacitive coupling clamp that is utilized for immunity tests against fast transients.",

keywords = "Eddy currents, Electrostatics, EMC, FEM",

author = "Susanne Bauer and Werner Renhart and Oszkar Biro",

year = "2017",

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doi = "10.1109/CEFC.2016.7816252",

language = "English",

booktitle = "IEEE CEFC 2016 - 17th Biennial Conference on Electromagnetic Field Computation",

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note = "17th Biennial IEEE Conference on Electromagnetic Field Computation, IEEE CEFC 2016 ; Conference date: 13-11-2016 Through 16-11-2016",

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AU - Bauer, Susanne

AU - Renhart, Werner

AU - Biro, Oszkar

PY - 2017/1/12

Y1 - 2017/1/12

N2 - This contribution outlines the extraction of circuit parameters with 3D finite elements from the standardized electromagnetic compatibility (EMC) measurement setup of the capacitive coupling clamp that is utilized for immunity tests against fast transients.

AB - This contribution outlines the extraction of circuit parameters with 3D finite elements from the standardized electromagnetic compatibility (EMC) measurement setup of the capacitive coupling clamp that is utilized for immunity tests against fast transients.

KW - Eddy currents

KW - Electrostatics

KW - EMC

KW - FEM

UR - http://www.scopus.com/inward/record.url?scp=85012013974&partnerID=8YFLogxK

U2 - 10.1109/CEFC.2016.7816252

DO - 10.1109/CEFC.2016.7816252

M3 - Conference paper

AN - SCOPUS:85012013974

BT - IEEE CEFC 2016 - 17th Biennial Conference on Electromagnetic Field Computation

PB - Institute of Electrical and Electronics Engineers

T2 - 17th Biennial IEEE Conference on Electromagnetic Field Computation, IEEE CEFC 2016

Y2 - 13 November 2016 through 16 November 2016

ER -

FEM-based Computation of circuit parameters for testing fast transients for EMC problems

Abstract

Konferenz

ASJC Scopus subject areas

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