Frequency-domain measurement method for the analysis of ESD generators and coupling

Jayong Koo*, Qing Cai, Giorgi Muchaidze, Andy Martwick, Kai Wang, David Pommerenke

*Korrespondierende/r Autor/-in für diese Arbeit

Publikation: Beitrag in einer FachzeitschriftArtikelBegutachtung


A method for analyzing electrostatic discharge (ESD) generators and coupling to equipment under test in the frequency domain is proposed. In ESD generators, the pulses are excited by the voltage collapse across relay contacts. The voltage collapse is replaced by one port of a vector network analyer (VNA). All the discrete and structural elements that form the ESD current pulse and the transient fields are excited by the VNA as if they were excited by the voltage collapse. In such a way, the method allows analyzing the current and field-driven linear coupling without having to discharge an ESD generator, eliminating the risk to the circuit and allowing the use of the wider dynamic range of a network analyzer relative to a real-time oscilloscope. The method is applicable to other voltage-collapse-driven tests, such as electrical fast transient, ultrawideband susceptibility testing but requires a linear coupling path.

Seiten (von - bis)504-511
FachzeitschriftIEEE Transactions on Electromagnetic Compatibility
PublikationsstatusVeröffentlicht - 1 Dez. 2007
Extern publiziertJa

ASJC Scopus subject areas

  • Atom- und Molekularphysik sowie Optik
  • Physik der kondensierten Materie
  • Elektrotechnik und Elektronik

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