GIDVis: a comprehensive software tool for geometry-independent grazing-incidence X-ray diffraction data analysis and pole-figure calculations

Benedikt Schrode*, Stefan Pachmajer, Michael Dohr, Christian Röthel, Jari Domke, Torsten Fritz, Roland Resel, Oliver Werzer

*Korrespondierende/r Autor/-in für diese Arbeit

Publikation: Beitrag in einer FachzeitschriftArtikelBegutachtung

Abstract

GIDVis is a software package based on MATLAB specialized for, but not limited to, the visualization and analysis of grazing-incidence thin-film X-ray diffraction data obtained during sample rotation around the surface normal. GIDVis allows the user to perform detector calibration, data stitching, intensity corrections, standard data evaluation (e.g. cuts and integrations along specific reciprocal-space directions), crystal phase analysis etc. To take full advantage of the measured data in the case of sample rotation, pole figures can easily be calculated from the experimental data for any value of the scattering angle covered. As an example, GIDVis is applied to phase analysis and the evaluation of the epitaxial alignment of pentacenequinone crystallites on a single-crystalline Au(111) surface.

Originalspracheenglisch
Seiten (von - bis)683-689
Seitenumfang7
FachzeitschriftJournal of Applied Crystallography
Jahrgang52
Ausgabenummer3
DOIs
PublikationsstatusVeröffentlicht - 1 Juni 2019

ASJC Scopus subject areas

  • Biochemie, Genetik und Molekularbiologie (insg.)

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