Highlighting the distribution path of transient disturbances by near field scanning techniques

B. Deutschmann; S. Schindlbacher; G. Winkler

doi:10.1007/s00502-015-0382-6

Highlighting the distribution path of transient disturbances by near field scanning techniques

Titel in Übersetzung: Visualisierung der Ausbreitungswege von transienten Störungen mittels Messungen im Nahfeld

B. Deutschmann, S. Schindlbacher, G. Winkler

Institut für Elektronik (4390)

Publikation: Beitrag in einer Fachzeitschrift › Artikel › Begutachtung

Abstract

Es gibt gegenwärtig viele verschiedene Messverfahren zur Charakterisierung der elektromagnetischen Verträglichkeit von elektronischen Geräten und Systemen. Eines dieser Messverfahren, die so genannte „Surface Scan Methode“, beruht auf der Messung des nahen magnetischen Feldes von Leiterplatten. Es ermöglicht die Visualisierung der Verteilung magnetischer Felder, welche direkt an der Oberfläche der Leiterplatte vorhanden sind. Mit Hilfe dieses Verfahrens können die Ursachen für Emissionsprobleme leicht aufgespürt werden. In diesem Beitrag wird gezeigt, wie eine solche Surface Scan Methode auch verwendet werden kann, um die Ausbreitungswege von transienten Störströmen zu visualisieren. Solche transienten Störungen können zum Beispiel durch eine elektrostatische Entladung beim Berühren der Leiterplatte verursacht werden.

Titel in Übersetzung	Visualisierung der Ausbreitungswege von transienten Störungen mittels Messungen im Nahfeld
Originalsprache	englisch
Seiten (von - bis)	18-24
Fachzeitschrift	Elektrotechnik und Informationstechnik
Jahrgang	133
Ausgabenummer	1
DOIs	https://doi.org/10.1007/s00502-015-0382-6
Publikationsstatus	Veröffentlicht - 2016

Schlagwörter

Elektromagnetische Verträglichkeit
Surface scan
Near field
EMC
EMV

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10.1007/s00502-015-0382-6

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abstract = "Many different measurement techniques are currently available to characterize the electromagnetic compatibility of electronic devices and systems. One of these techniques is known as the so-called “Surface Scan Method”. It is based on a near-field scanning technique and enables the visualization of the distribution of magnetic near field being present at the surface of printed circuit boards (PCBs). This technique provides an efficient way to find the sources of electromagnetic emission problems, as it can be used to pinpoint areas on the PCB which are usually the sources of the electromagnetic emission. In this paper it will be shown how such a surface scan technique can additionally be used to visualize the distribution path of transient disturbance currents. Such current surges can be caused by touching the PCB and thereby causing an electrostatic discharge directly into e.g. the connectors of the PCB.",

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AU - Deutschmann, B.

AU - Schindlbacher, S.

AU - Winkler, G.

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AB - Many different measurement techniques are currently available to characterize the electromagnetic compatibility of electronic devices and systems. One of these techniques is known as the so-called “Surface Scan Method”. It is based on a near-field scanning technique and enables the visualization of the distribution of magnetic near field being present at the surface of printed circuit boards (PCBs). This technique provides an efficient way to find the sources of electromagnetic emission problems, as it can be used to pinpoint areas on the PCB which are usually the sources of the electromagnetic emission. In this paper it will be shown how such a surface scan technique can additionally be used to visualize the distribution path of transient disturbance currents. Such current surges can be caused by touching the PCB and thereby causing an electrostatic discharge directly into e.g. the connectors of the PCB.

KW - Elektromagnetische Verträglichkeit

KW - Surface scan

KW - Near field

KW - EMC

KW - EMV

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Highlighting the distribution path of transient disturbances by near field scanning techniques

Abstract

Schlagwörter

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