Interactive Visual Exploration of defect prediction in industrial setting through explainable models based on SHAP values

Milot Gashi, Belgin Mutlu, Josef Suschnigg, Patrick Ofner, Stefan Pichler, Tobias Schreck

Publikation: Konferenzbeitrag › Poster › Begutachtung

Originalsprache	englisch
Publikationsstatus	Veröffentlicht - 2020
Veranstaltung	IEEE VIS 2020 - Virtuell, USA / Vereinigte Staaten Dauer: 25 Okt. 2020 → 30 Okt. 2020 http://ieeevis.org/year/2020/welcome

Konferenz	IEEE VIS 2020
Kurztitel	VIS 2020
Land/Gebiet	USA / Vereinigte Staaten
Ort	Virtuell
Zeitraum	25/10/20 → 30/10/20
Internetadresse	http://ieeevis.org/year/2020/welcome

Fields of Expertise

@conference{fd42a3da56c44c469126dba5e72d2cb1,

title = "Interactive Visual Exploration of defect prediction in industrial setting through explainable models based on SHAP values",

author = "Milot Gashi and Belgin Mutlu and Josef Suschnigg and Patrick Ofner and Stefan Pichler and Tobias Schreck",

note = "IEEE InfoVIS 2020; IEEE VIS 2020, VIS 2020 ; Conference date: 25-10-2020 Through 30-10-2020",

year = "2020",

language = "English",

url = "http://ieeevis.org/year/2020/welcome",

}

TY - CONF

T1 - Interactive Visual Exploration of defect prediction in industrial setting through explainable models based on SHAP values

AU - Gashi, Milot

AU - Mutlu, Belgin

AU - Suschnigg, Josef

AU - Ofner, Patrick

AU - Pichler, Stefan

AU - Schreck, Tobias

N1 - IEEE InfoVIS 2020

PY - 2020

Y1 - 2020

M3 - Poster

T2 - IEEE VIS 2020

Y2 - 25 October 2020 through 30 October 2020

ER -