Kelvin Probe Force Microscopy (KPFM) Measurements of NH3 Sensitive Organic Field Effect Transistors (OFETs) During Operation

Alexander Blümel; Peter Pacher; Simon Josef Außerlechner; Harald Plank; Andreas Klug; Egbert Zojer; Emil List

Kelvin Probe Force Microscopy (KPFM) Measurements of NH3 Sensitive Organic Field Effect Transistors (OFETs) During Operation

Alexander Blümel, Peter Pacher, Simon Josef Außerlechner, Harald Plank, Andreas Klug, Egbert Zojer, Emil List

Publikation: Konferenzbeitrag › Poster

Originalsprache	deutsch
Publikationsstatus	Veröffentlicht - 2010
Veranstaltung	2010 MRS Spring Meeting - San Francisco, USA Dauer: 5 Apr. 2010 → 9 Apr. 2010

Konferenz

Konferenz	2010 MRS Spring Meeting
Ort	San Francisco, USA
Zeitraum	5/04/10 → 9/04/10

Treatment code (Nähere Zuordnung)

Application
Experimental

Dieses zitieren

@conference{27ab6a0c15e64c5685f64eb415b5e6c6,

title = "Kelvin Probe Force Microscopy (KPFM) Measurements of NH3 Sensitive Organic Field Effect Transistors (OFETs) During Operation",

author = "Alexander Bl{\"u}mel and Peter Pacher and Au{\ss}erlechner, {Simon Josef} and Harald Plank and Andreas Klug and Egbert Zojer and Emil List",

year = "2010",

language = "deutsch",

note = "2010 MRS Spring Meeting ; Conference date: 05-04-2010 Through 09-04-2010",

}

TY - CONF

T1 - Kelvin Probe Force Microscopy (KPFM) Measurements of NH3 Sensitive Organic Field Effect Transistors (OFETs) During Operation

AU - Blümel, Alexander

AU - Pacher, Peter

AU - Außerlechner, Simon Josef

AU - Plank, Harald

AU - Klug, Andreas

AU - Zojer, Egbert

AU - List, Emil

PY - 2010

Y1 - 2010

M3 - Poster

T2 - 2010 MRS Spring Meeting

Y2 - 5 April 2010 through 9 April 2010

ER -