Markov Random Fields for Pattern Extraction in Analog Wafer Test Data

Stefan Schrunner, Olivia Bluder, Anja Zernig, Andre Kaestner, Roman Kern

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Originalsprache	deutsch
Titel	International Conference on Image Processing Theory, Tools and Applications (IPTA 2017)
Publikationsstatus	Veröffentlicht - 2017

Dieses zitieren

@inproceedings{f533a16fe5cd42408038c3037edd39b4,

title = "Markov Random Fields for Pattern Extraction in Analog Wafer Test Data",

author = "Stefan Schrunner and Olivia Bluder and Anja Zernig and Andre Kaestner and Roman Kern",

year = "2017",

language = "deutsch",

booktitle = "International Conference on Image Processing Theory, Tools and Applications (IPTA 2017)",

}