Model Based Test Case Generation for Distributed Embedded Systems

Valentin Constantin Chimisliu, Franz Wotawa

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Originalsprache	englisch
Titel	International Conference on Industrial Technology
Herausgeber (Verlag)	.
Seiten	p-p
Publikationsstatus	Veröffentlicht - 2012
Veranstaltung	International Conference on Industrial Technology - Athens, Griechenland Dauer: 19 März 2012 → 22 März 2012

Konferenz	International Conference on Industrial Technology
Land/Gebiet	Griechenland
Ort	Athens
Zeitraum	19/03/12 → 22/03/12

Fields of Expertise

@inproceedings{44e54a02b5b148b696d8b82a63027d5c,

title = "Model Based Test Case Generation for Distributed Embedded Systems",

author = "Chimisliu, {Valentin Constantin} and Franz Wotawa",

year = "2012",

language = "English",

pages = "p--p",

booktitle = "International Conference on Industrial Technology",

publisher = ".",

note = "International Conference on Industrial Technology ; Conference date: 19-03-2012 Through 22-03-2012",

}