Modelling of AFM-SECM systems: influence of tip geometry and insulation defects on limiting current for approach curves and images

Kelly Leonhardt, Guy Denuault, Bernhard Gollas

Publikation: Konferenzbeitrag › Poster

Originalsprache	englisch
Publikationsstatus	Veröffentlicht - 2010
Veranstaltung	61st Meeting of the International Society for Electrochemistry - Nizza Dauer: 26 Sept. 2010 → 1 Okt. 2010

Konferenz	61st Meeting of the International Society for Electrochemistry
Ort	Nizza
Zeitraum	26/09/10 → 1/10/10

Fields of Expertise

@conference{9bd1dae4d2ea484789df08605e9fa272,

title = "Modelling of AFM-SECM systems: influence of tip geometry and insulation defects on limiting current for approach curves and images",

author = "Kelly Leonhardt and Guy Denuault and Bernhard Gollas",

year = "2010",

language = "English",

note = "61st Meeting of the International Society for Electrochemistry ; Conference date: 26-09-2010 Through 01-10-2010",

}