Modelling of equivalent channel dimensions of enclosed-layout transistors, integrated on 180 nm MiAMoRE test chip

Varvara Bezhenova; Alicja Malgorzata Michalowska-Forsyth

Modelling of equivalent channel dimensions of enclosed-layout transistors, integrated on 180 nm MiAMoRE test chip

Varvara Bezhenova, Alicja Malgorzata Michalowska-Forsyth

Institut für Elektronik (4390)

Publikation: Konferenzbeitrag › Poster

Abstract

Originalsprache	englisch
Publikationsstatus	Veröffentlicht - 2017
Veranstaltung	The 13th International School on the Effects of Radiation on Embedded Systems for Space Applications - Leibniz Rechenzentrum, Garching, Deutschland Dauer: 23 Okt. 2017 → 26 Okt. 2017 Konferenznummer: 13 https://seressa.in.tum.de/

Workshop

Workshop	The 13th International School on the Effects of Radiation on Embedded Systems for Space Applications
Kurztitel	SERESSA 2017
Land/Gebiet	Deutschland
Ort	Garching
Zeitraum	23/10/17 → 26/10/17
Internetadresse	https://seressa.in.tum.de/

Fields of Expertise

Information, Communication & Computing

Modelling of equivalent channel dimensions of enclosed-layout transistors, integrated on 180nm MiAMoRE test chip
Varvara Bezhenova (Redner/in) & Alicja Malgorzata Michalowska-Forsyth (Redner/in)
23 Okt. 2017 → 26 Okt. 2017
Aktivität: Vortrag oder Präsentation › Posterpräsentation › Science to science

Dieses zitieren

Modelling of equivalent channel dimensions of enclosed-layout transistors, integrated on 180 nm MiAMoRE test chip. / Bezhenova, Varvara; Michalowska-Forsyth, Alicja Malgorzata.

2017. Postersitzung präsentiert bei The 13th International School on the Effects of Radiation on Embedded Systems for Space Applications, Garching, Deutschland.

Publikation: Konferenzbeitrag › Poster

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title = "Modelling of equivalent channel dimensions of enclosed-layout transistors, integrated on 180 nm MiAMoRE test chip",

keywords = "Total Ionizing Dose, MOS, X-ray, Integrated circuits",

author = "Varvara Bezhenova and Michalowska-Forsyth, {Alicja Malgorzata}",

year = "2017",

language = "English",

note = "The 13th International School on the Effects of Radiation on Embedded Systems for Space Applications, SERESSA 2017 ; Conference date: 23-10-2017 Through 26-10-2017",

url = "https://seressa.in.tum.de/",

}

TY - CONF

T1 - Modelling of equivalent channel dimensions of enclosed-layout transistors, integrated on 180 nm MiAMoRE test chip

AU - Bezhenova, Varvara

AU - Michalowska-Forsyth, Alicja Malgorzata

N1 - Conference code: 13

PY - 2017

Y1 - 2017

KW - Total Ionizing Dose

KW - MOS

KW - X-ray

KW - Integrated circuits

M3 - Poster

T2 - The 13th International School on the Effects of Radiation on Embedded Systems for Space Applications

Y2 - 23 October 2017 through 26 October 2017

ER -

Modelling of equivalent channel dimensions of enclosed-layout transistors, integrated on 180 nm MiAMoRE test chip

Abstract

Workshop

Fields of Expertise

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Aktivitäten

Modelling of equivalent channel dimensions of enclosed-layout transistors, integrated on 180nm MiAMoRE test chip

Dieses zitieren