Nanoanalytical characterization of an organic photodiode by electron microscopy and atomic force microscopy

Stefanie Fladischer, A.G. Neuhold, Stefan Mitsche, E. Kraker, A. Haase, B. Lamprecht, R. Resel, Werner Grogger

Publikation: Konferenzbeitrag › Poster

Originalsprache	englisch
Publikationsstatus	Veröffentlicht - 2010
Veranstaltung	International Conference of Organic Electronics 2010 - Paris, Frankreich Dauer: 22 Juni 2010 → 25 Juni 2010

Konferenz	International Conference of Organic Electronics 2010
Ort	Paris, Frankreich
Zeitraum	22/06/10 → 25/06/10

Treatment code (Nähere Zuordnung)

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title = "Nanoanalytical characterization of an organic photodiode by electron microscopy and atomic force microscopy",

author = "Stefanie Fladischer and A.G. Neuhold and Stefan Mitsche and E. Kraker and A. Haase and B. Lamprecht and R. Resel and Werner Grogger",

year = "2010",

language = "English",

note = "International Conference of Organic Electronics 2010 ; Conference date: 22-06-2010 Through 25-06-2010",

}

TY - CONF

T1 - Nanoanalytical characterization of an organic photodiode by electron microscopy and atomic force microscopy

AU - Fladischer, Stefanie

AU - Neuhold, A.G.

AU - Mitsche, Stefan

AU - Kraker, E.

AU - Haase, A.

AU - Lamprecht, B.

AU - Resel, R.

AU - Grogger, Werner

PY - 2010

Y1 - 2010

M3 - Poster

T2 - International Conference of Organic Electronics 2010

Y2 - 22 June 2010 through 25 June 2010

ER -