OPTIMIZING THE ENVIRONMENTAL SCANNING ELECTRON MICROSCOPE – GETTING HIGH IMAGE QUALITY ABOVE 1000 PA

Publikation: Konferenzbeitrag › Abstract › Begutachtung

Originalsprache	englisch
Seiten	O-159-166-167
Publikationsstatus	Veröffentlicht - 2015
Veranstaltung	Multinational Congress on Microscopy - Eger, Ungarn Dauer: 23 Aug. 2015 → 28 Aug. 2015

Konferenz	Multinational Congress on Microscopy
Land/Gebiet	Ungarn
Ort	Eger
Zeitraum	23/08/15 → 28/08/15

Fields of Expertise

@conference{803aa05d4d204ed38b9efd935da2da3b,

title = "OPTIMIZING THE ENVIRONMENTAL SCANNING ELECTRON MICROSCOPE – GETTING HIGH IMAGE QUALITY ABOVE 1000 PA",

author = "Fitzek, {Harald Matthias} and Hartmuth Schr{\"o}ttner and Julian Wagner and Ferdinand Hofer and Johannes Rattenberger",

year = "2015",

language = "English",

pages = "O--159--166--167",

note = "Multinational Congress on Microscopy ; Conference date: 23-08-2015 Through 28-08-2015",

}

TY - CONF

T1 - OPTIMIZING THE ENVIRONMENTAL SCANNING ELECTRON MICROSCOPE – GETTING HIGH IMAGE QUALITY ABOVE 1000 PA

AU - Fitzek, Harald Matthias

AU - Schröttner, Hartmuth

AU - Wagner, Julian

AU - Hofer, Ferdinand

AU - Rattenberger, Johannes

PY - 2015

Y1 - 2015

M3 - Abstract

SP - O-159-166-167

T2 - Multinational Congress on Microscopy

Y2 - 23 August 2015 through 28 August 2015

ER -