Performance Tests and Possibilities with a New 200 kV Monochromated (S)TEM

Suchergebnisse

• Analytische Transmissionselektronenmikroskopie

  Schaffer, B., Hofer, F., Rogers, M., Mitterbauer, C. & Wewerka, K.

  1/01/95 → 31/01/03

  Projekt: Arbeitsgebiet

  • Analytical Electron Microscopy 100%
  • Transmission Electron Microscopy 100%
  • Spectrometry 100%
  • Energy-Dispersive X-Ray Spectroscopy 50%
  • Convergent Beam Electron Diffraction 50%

• EELS Nahkantenfeinstrukturen

  Kothleitner, G., Grogger, W., Hofer, F., Wewerka, K., Letofsky-Papst, I. & Mitterbauer, C.

  1/02/00 → 31/12/05

  Projekt: Arbeitsgebiet

  • Nitride Compound 100%
  • Nitride 100%
  • Fine Structure 100%
  • Electron Energy Loss Near Edge Structure 66%
  • Metal Derivative 50%