Propagation of Linear Uncertainties through Multiline Thru-Reflect-Line Calibration

Ziad Hatab; Michael Ernst Gadringer; Wolfgang Bösch

doi:10.48550/arXiv.2301.09126

Propagation of Linear Uncertainties through Multiline Thru-Reflect-Line Calibration

Ziad Hatab, Michael Ernst Gadringer, Wolfgang Bösch

Institut für Hochfrequenztechnik (4510)

Publikation: Arbeitspapier › Preprint

Abstract

This study proposes a linear approach for propagating uncertainties in the multiline thru-reflect-line (TRL) calibration method for vector network analyzers (VNAs). The multiline TRL formulation we are proposing applies the law of uncertainty propagation as outlined in the ISO Guide to the Expression of Uncertainty in Measurement (GUM) to both measurement and model uncertainties. In addition, we conducted a Monte Carlo (MC) analysis using a combination of measured and synthetic data to model various uncertainties, such as measurement noise, reflect asymmetry, line mismatch, and line length offset. The results of our linear uncertainty formulation demonstrate agreement with the MC analysis and provide a more efficient means of assessing the uncertainty budget of the multiline TRL calibration.

Originalsprache	englisch
Herausgeber	arXiv
Seitenumfang	9
Band	72
DOIs	https://doi.org/10.48550/arXiv.2301.09126
Publikationsstatus	Veröffentlicht - 22 Jan. 2023

ASJC Scopus subject areas

Instrumentierung
Elektrotechnik und Elektronik

Fields of Expertise

Information, Communication & Computing

Treatment code (Nähere Zuordnung)

Experimental

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10.48550/arXiv.2301.09126Lizenz: CC BY-SA 4.0

2301.09126v1Akzeptiertes Autorenmanuskript, 6,67 MBLizenz: CC BY-SA 4.0

1 Laufend

CD-Labor für Technologie basiertes Design und Charakterisierung von elektronischen Komponenten
Bösch, W. (Teilnehmer (Co-Investigator)), Hatab, Z. (Teilnehmer (Co-Investigator)), Gadringer, M. E. (Teilnehmer (Co-Investigator)), Takahashi, H. (Teilnehmer (Co-Investigator)), Maier, C. (Teilnehmer (Co-Investigator)), Sarbandi Farahani, H. (Teilnehmer (Co-Investigator)), Pauser-Greistorfer, C. (Teilnehmer (Co-Investigator)), Paulitsch, H. (Teilnehmer (Co-Investigator)), Rezaee, B. (Teilnehmer (Co-Investigator)) & Fuchs, M. (Teilnehmer (Co-Investigator))
1/11/20 → 31/10/27
Projekt: Forschungsprojekt

1 Vortrag bei Konferenz oder Fachtagung

Advanced PCB Measurement Techniques for Millimeter-wave Frequencies and Beyond
Gadringer, M. E. (Redner/in) & Hatab, Z. (Redner/in)
23 Sept. 2024
Aktivität: Vortrag oder Präsentation › Vortrag bei Konferenz oder Fachtagung › Science to science

2 Artikel
1 Beitrag in einem Konferenzband

Modified Semi-Additive Manufacturing of PCBs for Enabling Accurate Device Measurements at Millimeter-Wave and Sub-Terahertz Frequencies
Arsanjani, A., Hatab, Z., Alterkawi, A. B. A., Gadringer, M. E. & Bösch, W., 21 Juni 2024, 103rd ARFTG Microwave Measurement Conference: Advanced Measurement Techniques for Next-G Communication Systems, ARFTG 2024. IEEE CSP, 4 S. 10660794
Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung
Propagation of Linear Uncertainties through Multiline Thru-Reflect-Line Calibration
Hatab, Z., Gadringer, M. E. & Bösch, W., 2023, in: IEEE Transactions on Instrumentation and Measurement. 72, 9 S., 1007409.
Publikation: Beitrag in einer Fachzeitschrift › Artikel › Begutachtung

Open Access
Datei
Validation of the Reference Impedance in Multiline Calibration with Stepped Impedance Standards
Hatab, Z., Gadringer, M. E., Alterkawi, A. B. A. & Bösch, W., 14 Sept. 2023, in: IEEE Open Journal of Instrumentation and Measurement. 2, 12 S., 10251578.
Publikation: Beitrag in einer Fachzeitschrift › Artikel › Begutachtung

Open Access
Datei

Dieses zitieren

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abstract = "This study proposes a linear approach for propagating uncertainties in the multiline thru-reflect-line (TRL) calibration method for vector network analyzers (VNAs). The multiline TRL formulation we are proposing applies the law of uncertainty propagation as outlined in the ISO Guide to the Expression of Uncertainty in Measurement (GUM) to both measurement and model uncertainties. In addition, we conducted a Monte Carlo (MC) analysis using a combination of measured and synthetic data to model various uncertainties, such as measurement noise, reflect asymmetry, line mismatch, and line length offset. The results of our linear uncertainty formulation demonstrate agreement with the MC analysis and provide a more efficient means of assessing the uncertainty budget of the multiline TRL calibration.",

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AU - Gadringer, Michael Ernst

AU - Bösch, Wolfgang

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PY - 2023/1/22

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N2 - This study proposes a linear approach for propagating uncertainties in the multiline thru-reflect-line (TRL) calibration method for vector network analyzers (VNAs). The multiline TRL formulation we are proposing applies the law of uncertainty propagation as outlined in the ISO Guide to the Expression of Uncertainty in Measurement (GUM) to both measurement and model uncertainties. In addition, we conducted a Monte Carlo (MC) analysis using a combination of measured and synthetic data to model various uncertainties, such as measurement noise, reflect asymmetry, line mismatch, and line length offset. The results of our linear uncertainty formulation demonstrate agreement with the MC analysis and provide a more efficient means of assessing the uncertainty budget of the multiline TRL calibration.

AB - This study proposes a linear approach for propagating uncertainties in the multiline thru-reflect-line (TRL) calibration method for vector network analyzers (VNAs). The multiline TRL formulation we are proposing applies the law of uncertainty propagation as outlined in the ISO Guide to the Expression of Uncertainty in Measurement (GUM) to both measurement and model uncertainties. In addition, we conducted a Monte Carlo (MC) analysis using a combination of measured and synthetic data to model various uncertainties, such as measurement noise, reflect asymmetry, line mismatch, and line length offset. The results of our linear uncertainty formulation demonstrate agreement with the MC analysis and provide a more efficient means of assessing the uncertainty budget of the multiline TRL calibration.

KW - eess.SP

KW - physics.app-ph

KW - Uncertainty

KW - metrology

KW - Calibration

KW - Matrix decomposition

KW - traceability

KW - Standards

KW - uncertainty propagation

KW - microwave measurement

KW - Measurement uncertainty

KW - vector network analyzer

KW - Eigenvalues and eigenfunctions

KW - Mathematical models

KW - calibration

KW - vector network analyzer (VNA)

U2 - 10.48550/arXiv.2301.09126

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BT - Propagation of Linear Uncertainties through Multiline Thru-Reflect-Line Calibration

PB - arXiv

ER -

Propagation of Linear Uncertainties through Multiline Thru-Reflect-Line Calibration

Abstract

ASJC Scopus subject areas

Fields of Expertise

Treatment code (Nähere Zuordnung)

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Projekte

CD-Labor für Technologie basiertes Design und Charakterisierung von elektronischen Komponenten

Aktivitäten

Advanced PCB Measurement Techniques for Millimeter-wave Frequencies and Beyond

Publikationen

Modified Semi-Additive Manufacturing of PCBs for Enabling Accurate Device Measurements at Millimeter-Wave and Sub-Terahertz Frequencies

Propagation of Linear Uncertainties through Multiline Thru-Reflect-Line Calibration

Validation of the Reference Impedance in Multiline Calibration with Stepped Impedance Standards

Dieses zitieren