Quantitative EDX and EELS Elemental Mapping at Atomic Resolution

Gerald Kothleitner, M.J. Neish, N.R. Lugg, S.D. Findlay, Werner Grogger, Ferdinand Hofer, L.J. Allen

Publikation: Konferenzbeitrag › (Altdaten) Vortrag oder Präsentation

Originalsprache	englisch
Publikationsstatus	Veröffentlicht - 4 Aug. 2014
Veranstaltung	Microscopy and Microanalysis 2014 - Hartford, USA Dauer: 3 Aug. 2014 → 7 Aug. 2014

Konferenz	Microscopy and Microanalysis 2014
Ort	Hartford, USA
Zeitraum	3/08/14 → 7/08/14

Fields of Expertise

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title = "Quantitative EDX and EELS Elemental Mapping at Atomic Resolution",

author = "Gerald Kothleitner and M.J. Neish and N.R. Lugg and S.D. Findlay and Werner Grogger and Ferdinand Hofer and L.J. Allen",

year = "2014",

month = aug,

day = "4",

language = "English",

note = "Microscopy and Microanalysis 2014 ; Conference date: 03-08-2014 Through 07-08-2014",

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TY - CONF

T1 - Quantitative EDX and EELS Elemental Mapping at Atomic Resolution

AU - Kothleitner, Gerald

AU - Neish, M.J.

AU - Lugg, N.R.

AU - Findlay, S.D.

AU - Grogger, Werner

AU - Hofer, Ferdinand

AU - Allen, L.J.

PY - 2014/8/4

Y1 - 2014/8/4

M3 - (Old data) Lecture or Presentation

T2 - Microscopy and Microanalysis 2014

Y2 - 3 August 2014 through 7 August 2014

ER -