TY - JOUR
T1 - Reactive Current Response of Grid-Forming Converters during Low-Voltage-Ride-Through: Analysis of Test Method Impact
AU - Zhang, Ziqian
AU - Schuerhuber, Robert
AU - Fickert, Lothar
AU - Chen, Guochu
PY - 2024/7/10
Y1 - 2024/7/10
N2 - This paper presents an examination of grid-forming converters (GFM) under low-voltage-ride-through (LVRT) conditions. It emphasizes the influence of inner loop control strategies, and grid topologies on GFM performance. The study introduces a versatile equivalent modeling methodology suitable for different inner loop control strategies. Additionally, it evaluates three LVRT testing devices: the shunt impedance based voltages aggenerator (SIVSG), programmable voltage source with impedance (PVS), and Hardware-in-the-Loop (HIL) system, highlighting their differences in simulating grid fault characteristics. The results indicate that SIVSG and PVS have limitations in mimicking actual grid fault scenarios, potentially leading to GFMs erroneously passing LVRT tests. Conversely, HIL-based testing methods more accurately replicate grid faults, offering a more reliable assessment of GFM performance.
AB - This paper presents an examination of grid-forming converters (GFM) under low-voltage-ride-through (LVRT) conditions. It emphasizes the influence of inner loop control strategies, and grid topologies on GFM performance. The study introduces a versatile equivalent modeling methodology suitable for different inner loop control strategies. Additionally, it evaluates three LVRT testing devices: the shunt impedance based voltages aggenerator (SIVSG), programmable voltage source with impedance (PVS), and Hardware-in-the-Loop (HIL) system, highlighting their differences in simulating grid fault characteristics. The results indicate that SIVSG and PVS have limitations in mimicking actual grid fault scenarios, potentially leading to GFMs erroneously passing LVRT tests. Conversely, HIL-based testing methods more accurately replicate grid faults, offering a more reliable assessment of GFM performance.
KW - Circuit faults
KW - current-limitation
KW - Grid forming
KW - grid-forming
KW - hardware-in-the-loop
KW - Impedance
KW - Integrated circuit modeling
KW - Limiting
KW - low-voltageride-through
KW - Power quality
KW - Voltage control
UR - http://www.scopus.com/inward/record.url?scp=85198282068&partnerID=8YFLogxK
U2 - 10.1109/TEC.2024.3425912
DO - 10.1109/TEC.2024.3425912
M3 - Article
SN - 0885-8969
SP - 1
EP - 12
JO - IEEE Transactions on Energy Conversion
JF - IEEE Transactions on Energy Conversion
ER -