Robust Local Features and their Application in Self-Calibration and Object Recognition on Embedded Systems

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Originalsprache	englisch
Titel	Proceedings of Workshop on Embedded Computer Vision
Herausgeber (Verlag)	Institute of Electrical and Electronics Engineers
Seiten	01-02
Publikationsstatus	Veröffentlicht - 2007
Veranstaltung	2006 IEEE Conference on Computer Vision and Pattern Recognition: CVPR 2006 - New York, USA / Vereinigte Staaten Dauer: 17 Juni 2006 → 22 Juni 2006

Konferenz	2006 IEEE Conference on Computer Vision and Pattern Recognition
Land/Gebiet	USA / Vereinigte Staaten
Ort	New York
Zeitraum	17/06/06 → 22/06/06

Treatment code (Nähere Zuordnung)

VM-GPU - Variational Methods on the GPU for Industrial Problems
Grabner, M., Pock, T., Unger, M., Santner, J. & Bischof, H.
1/06/07 → 28/02/10
Projekt: Forschungsprojekt
Evis - Autonomous Traffic Monitoring by Embedded Vision
Sternig, S., Godec-Schönbacher, M., Leistner, C., Bischof, H. & Kontschieder, P.
1/05/07 → 30/06/10
Projekt: Forschungsprojekt

Robust Local Features and their Application in Self-Calibration and Object Recognition on Embedded Systems. / Arth, Clemens; Leistner, Christian; Bischof, Horst.
Proceedings of Workshop on Embedded Computer Vision. Institute of Electrical and Electronics Engineers, 2007. S. 01-02.

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Arth, C, Leistner, C & Bischof, H 2007, Robust Local Features and their Application in Self-Calibration and Object Recognition on Embedded Systems. in Proceedings of Workshop on Embedded Computer Vision. Institute of Electrical and Electronics Engineers, S. 01-02, 2006 IEEE Conference on Computer Vision and Pattern Recognition, New York, USA / Vereinigte Staaten, 17/06/06.

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title = "Robust Local Features and their Application in Self-Calibration and Object Recognition on Embedded Systems",

author = "Clemens Arth and Christian Leistner and Horst Bischof",

year = "2007",

language = "English",

pages = "01--02",

booktitle = "Proceedings of Workshop on Embedded Computer Vision",

publisher = "Institute of Electrical and Electronics Engineers",

address = "United States",

note = "2006 IEEE Conference on Computer Vision and Pattern Recognition : CVPR 2006 ; Conference date: 17-06-2006 Through 22-06-2006",

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T1 - Robust Local Features and their Application in Self-Calibration and Object Recognition on Embedded Systems

AU - Arth, Clemens

AU - Leistner, Christian

AU - Bischof, Horst

PY - 2007

Y1 - 2007

M3 - Conference paper

SP - 1

EP - 2

BT - Proceedings of Workshop on Embedded Computer Vision

PB - Institute of Electrical and Electronics Engineers

T2 - 2006 IEEE Conference on Computer Vision and Pattern Recognition

Y2 - 17 June 2006 through 22 June 2006

ER -