Robust mTRL implementation for probing standards manufactured on PCBs

Michael E. Gadringer

doi:10.1109/ARFTG52261.2021.9640218

Robust mTRL implementation for probing standards manufactured on PCBs

Michael E. Gadringer

Institut für Hochfrequenztechnik (4510)

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Abstract

The Through-Reflect-Line (TRL) and multiline-TRL (mTRL) calibration are well known for accurate parameterization of the systematic errors of a vector network analyzer (VNA). When applying this approach to calibration/deembedding in connection with PCBs tested on a probe station, the imperfections of the RF probe to PCB transitions add to the overall measurement uncertainty. These measurement imperfections may result in an incorrect output of the mTRL algorithm due to faulty measurements. To mitigate this situation, an implementation of the mTRL calibration is presented which, on the one hand, focuses on a robust implementation able to cope with mentioned measurement conditions and, on the other hand, tags possible improper measurements.

Originalsprache	englisch
Titel	97th ARFTG Microwave Measurement Conference
Untertitel	Conducted and Ota Measurement Challenges for Urban, Rural and SatComm Connectivity, ARFTG 2021
Herausgeber (Verlag)	IEEE Publications
Seiten	1-4
Seitenumfang	4
ISBN (elektronisch)	9780738112480
ISBN (Print)	978-1-6654-4794-2
DOIs	https://doi.org/10.1109/ARFTG52261.2021.9640218
Publikationsstatus	Veröffentlicht - 25 Juni 2021
Veranstaltung	97th ARFTG Microwave Measurement Conference: Conducted and Ota Measurement Challenges for Urban, Rural and SatComm Connectivity: ARFTG 2021 - Virtual, Atlanta, USA / Vereinigte Staaten Dauer: 25 Juni 2021 → 25 Juni 2021

Publikationsreihe

Name	97th ARFTG Microwave Measurement Conference: Conducted and Ota Measurement Challenges for Urban, Rural and SatComm Connectivity, ARFTG 2021

Konferenz

Konferenz	97th ARFTG Microwave Measurement Conference: Conducted and Ota Measurement Challenges for Urban, Rural and SatComm Connectivity
Kurztitel	ARFTG 2021
Land/Gebiet	USA / Vereinigte Staaten
Ort	Virtual, Atlanta
Zeitraum	25/06/21 → 25/06/21

ASJC Scopus subject areas

Instrumentierung
Elektrotechnik und Elektronik
Computernetzwerke und -kommunikation

Fields of Expertise

Information, Communication & Computing

Treatment code (Nähere Zuordnung)

Experimental

Zugriff auf Dokument

10.1109/ARFTG52261.2021.9640218

https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9640218

Andere Dateien und Links

Verknüpfung zur Publikation in Scopus

1 Abgeschlossen
1 Laufend

CD-Labor für Technologie basiertes Design und Charakterisierung von elektronischen Komponenten
Bösch, W. (Teilnehmer (Co-Investigator)), Hatab, Z. (Teilnehmer (Co-Investigator)), Gadringer, M. E. (Teilnehmer (Co-Investigator)), Takahashi, H. (Teilnehmer (Co-Investigator)), Maier, C. (Teilnehmer (Co-Investigator)), Sarbandi Farahani, H. (Teilnehmer (Co-Investigator)), Pauser-Greistorfer, C. (Teilnehmer (Co-Investigator)), Paulitsch, H. (Teilnehmer (Co-Investigator)), Rezaee, B. (Teilnehmer (Co-Investigator)) & Fuchs, M. (Teilnehmer (Co-Investigator))
1/11/20 → 31/10/27
Projekt: Forschungsprojekt
Hochfrequenz und mm-Wellen Messtechnik
Amschl, D. (Teilnehmer (Co-Investigator)), Gruber, A. (Teilnehmer (Co-Investigator)), Gadringer, M. E. (Teilnehmer (Co-Investigator)), Auinger, B. (Teilnehmer (Co-Investigator)), Paulitsch, H. (Teilnehmer (Co-Investigator)), Sattler, S. (Teilnehmer (Co-Investigator)), Bösch, W. (Teilnehmer (Co-Investigator)), Schreiber, H. (Teilnehmer (Co-Investigator)) & Freidl, P. F. (Teilnehmer (Co-Investigator))
1/01/10 → 31/12/24
Projekt: Arbeitsgebiet

The Automatic RF Techniques Group - Best Oral Presentation Award
Gadringer, M. E. (Empfänger/-in), 24 Juni 2022
Auszeichnung: Preise / Medaillen / Ehrungen

Datei

1 Artikel

mm-Wave Complex Permittivity Extraction of LTCC Substrate Under the Influence of Surface Roughness
Hatab, Z., Gadringer, M. E., Habib, M. K. A. & Bösch, W., 16 Feb. 2022, in: IEEE Transactions on Instrumentation and Measurement. 71, 11 S., 6001711.
Publikation: Beitrag in einer Fachzeitschrift › Artikel › Begutachtung

Open Access
Datei

Dieses zitieren

Gadringer, M. E. (2021). Robust mTRL implementation for probing standards manufactured on PCBs. in 97th ARFTG Microwave Measurement Conference: Conducted and Ota Measurement Challenges for Urban, Rural and SatComm Connectivity, ARFTG 2021 (S. 1-4). Artikel 9640218 (97th ARFTG Microwave Measurement Conference: Conducted and Ota Measurement Challenges for Urban, Rural and SatComm Connectivity, ARFTG 2021). IEEE Publications. https://doi.org/10.1109/ARFTG52261.2021.9640218

Robust mTRL implementation for probing standards manufactured on PCBs. / Gadringer, Michael E.
97th ARFTG Microwave Measurement Conference: Conducted and Ota Measurement Challenges for Urban, Rural and SatComm Connectivity, ARFTG 2021. IEEE Publications, 2021. S. 1-4 9640218 (97th ARFTG Microwave Measurement Conference: Conducted and Ota Measurement Challenges for Urban, Rural and SatComm Connectivity, ARFTG 2021).

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Gadringer, ME 2021, Robust mTRL implementation for probing standards manufactured on PCBs. in 97th ARFTG Microwave Measurement Conference: Conducted and Ota Measurement Challenges for Urban, Rural and SatComm Connectivity, ARFTG 2021., 9640218, 97th ARFTG Microwave Measurement Conference: Conducted and Ota Measurement Challenges for Urban, Rural and SatComm Connectivity, ARFTG 2021, IEEE Publications, S. 1-4, 97th ARFTG Microwave Measurement Conference: Conducted and Ota Measurement Challenges for Urban, Rural and SatComm Connectivity, Virtual, Atlanta, Georgia, USA / Vereinigte Staaten, 25/06/21. https://doi.org/10.1109/ARFTG52261.2021.9640218

Gadringer ME. Robust mTRL implementation for probing standards manufactured on PCBs. in 97th ARFTG Microwave Measurement Conference: Conducted and Ota Measurement Challenges for Urban, Rural and SatComm Connectivity, ARFTG 2021. IEEE Publications. 2021. S. 1-4. 9640218. (97th ARFTG Microwave Measurement Conference: Conducted and Ota Measurement Challenges for Urban, Rural and SatComm Connectivity, ARFTG 2021). doi: 10.1109/ARFTG52261.2021.9640218

Gadringer, Michael E. / Robust mTRL implementation for probing standards manufactured on PCBs. 97th ARFTG Microwave Measurement Conference: Conducted and Ota Measurement Challenges for Urban, Rural and SatComm Connectivity, ARFTG 2021. IEEE Publications, 2021. S. 1-4 (97th ARFTG Microwave Measurement Conference: Conducted and Ota Measurement Challenges for Urban, Rural and SatComm Connectivity, ARFTG 2021).

@inproceedings{0bcc4c3be14349c4a174132897aea0b6,

title = "Robust mTRL implementation for probing standards manufactured on PCBs",

abstract = "The Through-Reflect-Line (TRL) and multiline-TRL (mTRL) calibration are well known for accurate parameterization of the systematic errors of a vector network analyzer (VNA). When applying this approach to calibration/deembedding in connection with PCBs tested on a probe station, the imperfections of the RF probe to PCB transitions add to the overall measurement uncertainty. These measurement imperfections may result in an incorrect output of the mTRL algorithm due to faulty measurements. To mitigate this situation, an implementation of the mTRL calibration is presented which, on the one hand, focuses on a robust implementation able to cope with mentioned measurement conditions and, on the other hand, tags possible improper measurements.",

keywords = "Radio frequency, Uncertainty, Systematics, Measurement uncertainty, Network analyzers, Calibration, Propagation constant, MTRL, S-parameters, VNA, Planar substrates, PCB, On-wafer",

author = "Gadringer, {Michael E.}",

year = "2021",

month = jun,

day = "25",

doi = "10.1109/ARFTG52261.2021.9640218",

language = "English",

isbn = "978-1-6654-4794-2",

series = "97th ARFTG Microwave Measurement Conference: Conducted and Ota Measurement Challenges for Urban, Rural and SatComm Connectivity, ARFTG 2021",

publisher = "IEEE Publications",

pages = "1--4",

booktitle = "97th ARFTG Microwave Measurement Conference",

note = "97th ARFTG Microwave Measurement Conference: Conducted and Ota Measurement Challenges for Urban, Rural and SatComm Connectivity : ARFTG 2021, ARFTG 2021 ; Conference date: 25-06-2021 Through 25-06-2021",

}

TY - GEN

T1 - Robust mTRL implementation for probing standards manufactured on PCBs

AU - Gadringer, Michael E.

PY - 2021/6/25

Y1 - 2021/6/25

N2 - The Through-Reflect-Line (TRL) and multiline-TRL (mTRL) calibration are well known for accurate parameterization of the systematic errors of a vector network analyzer (VNA). When applying this approach to calibration/deembedding in connection with PCBs tested on a probe station, the imperfections of the RF probe to PCB transitions add to the overall measurement uncertainty. These measurement imperfections may result in an incorrect output of the mTRL algorithm due to faulty measurements. To mitigate this situation, an implementation of the mTRL calibration is presented which, on the one hand, focuses on a robust implementation able to cope with mentioned measurement conditions and, on the other hand, tags possible improper measurements.

AB - The Through-Reflect-Line (TRL) and multiline-TRL (mTRL) calibration are well known for accurate parameterization of the systematic errors of a vector network analyzer (VNA). When applying this approach to calibration/deembedding in connection with PCBs tested on a probe station, the imperfections of the RF probe to PCB transitions add to the overall measurement uncertainty. These measurement imperfections may result in an incorrect output of the mTRL algorithm due to faulty measurements. To mitigate this situation, an implementation of the mTRL calibration is presented which, on the one hand, focuses on a robust implementation able to cope with mentioned measurement conditions and, on the other hand, tags possible improper measurements.

KW - Radio frequency

KW - Uncertainty

KW - Systematics

KW - Measurement uncertainty

KW - Network analyzers

KW - Calibration

KW - Propagation constant

KW - MTRL

KW - S-parameters

KW - VNA

KW - Planar substrates

KW - PCB

KW - On-wafer

UR - http://www.scopus.com/inward/record.url?scp=85123930797&partnerID=8YFLogxK

U2 - 10.1109/ARFTG52261.2021.9640218

DO - 10.1109/ARFTG52261.2021.9640218

M3 - Conference paper

SN - 978-1-6654-4794-2

T3 - 97th ARFTG Microwave Measurement Conference: Conducted and Ota Measurement Challenges for Urban, Rural and SatComm Connectivity, ARFTG 2021

SP - 1

EP - 4

BT - 97th ARFTG Microwave Measurement Conference

PB - IEEE Publications

T2 - 97th ARFTG Microwave Measurement Conference: Conducted and Ota Measurement Challenges for Urban, Rural and SatComm Connectivity

Y2 - 25 June 2021 through 25 June 2021

ER -

Robust mTRL implementation for probing standards manufactured on PCBs

Abstract

Publikationsreihe

Konferenz

ASJC Scopus subject areas

Fields of Expertise

Treatment code (Nähere Zuordnung)

Zugriff auf Dokument

Andere Dateien und Links

Projekte

CD-Labor für Technologie basiertes Design und Charakterisierung von elektronischen Komponenten

Hochfrequenz und mm-Wellen Messtechnik

Auszeichnungen

The Automatic RF Techniques Group - Best Oral Presentation Award

Publikationen

mm-Wave Complex Permittivity Extraction of LTCC Substrate Under the Influence of Surface Roughness

Dieses zitieren