TY - GEN
T1 - Scalable Multitasking Dynamic Pulse Based Reliability Stress Test for High Voltage Discrete Semiconductors
AU - Patmanidis, Konstantinos
AU - Glavanovics, Michael
AU - Muetze, Annette
N1 - Funding Information:
This work was funded by the Austrian Research Promotion Agency (FFG, Project No. 881110).
Publisher Copyright:
© 2021 EPE Association.
PY - 2021/9/6
Y1 - 2021/9/6
N2 - High voltage power electronic devices undergo various stressors in their application environment, leading to long-term degradation and final catastrophic failure. This accumulated damage needs to be investigated during the development phase, as well as its impact on the device long-term performance. Therefore, power semiconductors should be subjected to repetitive stress testing in order to study the aging mechanisms as well as potential unknown failures before commercializing. Additionally, owing to manufacturing process variations and material tolerances, it is imperative to stress a sufficient number of devices for a meaningful statistical analysis. Taking into account these facts, this paper introduces a scalable reliability stress test system that covers various dynamic pulse stress scenarios, such as short circuit (SC), unclamped inductive switching (UIS) and double pulse testing (DPT), while assuring its robustness under worst-case conditions.
AB - High voltage power electronic devices undergo various stressors in their application environment, leading to long-term degradation and final catastrophic failure. This accumulated damage needs to be investigated during the development phase, as well as its impact on the device long-term performance. Therefore, power semiconductors should be subjected to repetitive stress testing in order to study the aging mechanisms as well as potential unknown failures before commercializing. Additionally, owing to manufacturing process variations and material tolerances, it is imperative to stress a sufficient number of devices for a meaningful statistical analysis. Taking into account these facts, this paper introduces a scalable reliability stress test system that covers various dynamic pulse stress scenarios, such as short circuit (SC), unclamped inductive switching (UIS) and double pulse testing (DPT), while assuring its robustness under worst-case conditions.
KW - Discrete power device
KW - Double pulse test
KW - Parallel operation
KW - Pulsed Current
KW - Reliability
UR - http://www.scopus.com/inward/record.url?scp=85119083735&partnerID=8YFLogxK
M3 - Conference paper
AN - SCOPUS:85119083735
T3 - 2021 23rd European Conference on Power Electronics and Applications, EPE 2021 ECCE Europe
BT - 2021 23rd European Conference on Power Electronics and Applications, EPE 2021 ECCE Europe
PB - Institute of Electrical and Electronics Engineers
T2 - 23rd European Conference on Power Electronics and Applications, EPE 2021 ECCE Europe
Y2 - 6 September 2021 through 10 September 2021
ER -