Temperature Behavior Mismatch of Halo Implanted Short Channel Transistors and its Influence on PUF Circuits

Maximilian Hofer, Christoph Böhm, Wolfgang Pribyl

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Originalsprache	deutsch
Titel	ISIC2011
Herausgeber (Verlag)	IEEE
Publikationsstatus	Angenommen/In Druck - 2011
Veranstaltung	International Symposium on Integrated Circuits, ISIC - Singapur, Singapur Dauer: 12 Dez. 2011 → 15 Dez. 2011

Konferenz	International Symposium on Integrated Circuits, ISIC
Land/Gebiet	Singapur
Ort	Singapur
Zeitraum	12/12/11 → 15/12/11

Fields of Expertise

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title = "Temperature Behavior Mismatch of Halo Implanted Short Channel Transistors and its Influence on PUF Circuits",

author = "Maximilian Hofer and Christoph B{\"o}hm and Wolfgang Pribyl",

year = "2011",

language = "deutsch",

booktitle = "ISIC2011",

publisher = "IEEE",

address = "USA / Vereinigte Staaten",

note = "International Symposium on Integrated Circuits, ISIC ; Conference date: 12-12-2011 Through 15-12-2011",

}

TY - GEN

T1 - Temperature Behavior Mismatch of Halo Implanted Short Channel Transistors and its Influence on PUF Circuits

AU - Hofer, Maximilian

AU - Böhm, Christoph

AU - Pribyl, Wolfgang

PY - 2011

Y1 - 2011

M3 - Beitrag in einem Konferenzband

BT - ISIC2011

PB - IEEE

T2 - International Symposium on Integrated Circuits, ISIC

Y2 - 12 December 2011 through 15 December 2011

ER -