Time domain FEM computational approach for calibration of surface scan method

Susanne Bauer, Oszkar Biro, Gergely Koczka, Andreas Gleinser, Gunter Winkler, Bernd Deutschmann

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem KonferenzbandBegutachtung

Abstract

The surface scan method constitutes an effective methodology to characterize printed circuit boards and integrated circuits in terms of electromagnetic emission and immunity. It is a useful technique to locate areas of critical radiation or susceptibility which could influence the performance of devices nearby or the device under test itself. The radiated near-field gathered during the test sequence is effectively influenced by the electric-and magnetic-field probes used in the course of the measurement process hence a calibration of the setup is required. This calibration is done via a 3D-FEM-wave simulation in the time domain, stimulated with a Gaussian pulse, to gather the near-field behavior over the frequency range of interest. The numerically derived results can be used during post processing to eliminate the probe's influence on the measured results.

Originalspracheenglisch
Titel2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018
Herausgeber (Verlag)Institute of Electrical and Electronics Engineers
Seiten866-871
Seitenumfang6
ISBN (elektronisch)9781509059973
DOIs
PublikationsstatusVeröffentlicht - 22 Juni 2018
Veranstaltung60th IEEE International Symposium on Electromagnetic Compatibility and 9th IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018 - Suntec City, Singapur
Dauer: 14 Mai 201818 Mai 2018

Konferenz

Konferenz60th IEEE International Symposium on Electromagnetic Compatibility and 9th IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018
Land/GebietSingapur
OrtSuntec City
Zeitraum14/05/1818/05/18

ASJC Scopus subject areas

  • Luft- und Raumfahrttechnik
  • Elektrotechnik und Elektronik
  • Sicherheit, Risiko, Zuverlässigkeit und Qualität
  • Strahlung

Fields of Expertise

  • Information, Communication & Computing

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