Total scattering cross section of N2 and effective beam gas path length measurements in a low vacuum scanning electron microscope.

Publikation: Konferenzbeitrag › Poster

Originalsprache	englisch
Publikationsstatus	Veröffentlicht - 2008
Veranstaltung	MicroScience - London, Großbritannien / Vereinigtes Königreich Dauer: 23 Juni 2008 → 27 Juni 2008

Konferenz	MicroScience
Land/Gebiet	Großbritannien / Vereinigtes Königreich
Ort	London
Zeitraum	23/06/08 → 27/06/08

Treatment code (Nähere Zuordnung)

@conference{a8225d41b7f64b1f84cd02c3b2f7dd35,

title = "Total scattering cross section of N2 and effective beam gas path length measurements in a low vacuum scanning electron microscope.",

author = "Johannes Rattenberger and Julian Wagner and Hartmuth Schr{\"o}ttner and Stefan Mitsche and Bernhard Schaffer and Armin Zankel",

year = "2008",

language = "English",

note = "MicroScience ; Conference date: 23-06-2008 Through 27-06-2008",

}

TY - CONF

T1 - Total scattering cross section of N2 and effective beam gas path length measurements in a low vacuum scanning electron microscope.

AU - Rattenberger, Johannes

AU - Wagner, Julian

AU - Schröttner, Hartmuth

AU - Mitsche, Stefan

AU - Schaffer, Bernhard

AU - Zankel, Armin

PY - 2008

Y1 - 2008

M3 - Poster

T2 - MicroScience

Y2 - 23 June 2008 through 27 June 2008

ER -