Towards single atom sensitivity in the analytical TEM

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Originalsprache	englisch
Titel	European Microscopy Congress
Herausgeber (Verlag)	.
Seiten	685-686
Band	Volume:2
ISBN (Print)	978-0-9502463-6-9
Publikationsstatus	Veröffentlicht - 2012
Veranstaltung	European Microscopy Congress - Manchester Dauer: 16 Sept. 2012 → 21 Sept. 2012

Name	Physical Sciences: Tools and Techniques

Konferenz	European Microscopy Congress
Ort	Manchester
Zeitraum	16/09/12 → 21/09/12

Fields of Expertise

@inproceedings{eba67cb0992444f59aeee8eaa3c16ebd,

title = "Towards single atom sensitivity in the analytical TEM",

author = "Werner Grogger and Christian Gspan and Stefanie Fladischer and Gerald Kothleitner and Ferdinand Hofer",

year = "2012",

language = "English",

isbn = "978-0-9502463-6-9",

volume = "Volume:2",

series = "Physical Sciences: Tools and Techniques",

publisher = ".",

pages = "685--686",

booktitle = "European Microscopy Congress",

note = "European Microscopy Congress ; Conference date: 16-09-2012 Through 21-09-2012",

}

TY - GEN

T1 - Towards single atom sensitivity in the analytical TEM

AU - Grogger, Werner

AU - Gspan, Christian

AU - Fladischer, Stefanie

AU - Kothleitner, Gerald

AU - Hofer, Ferdinand

PY - 2012

Y1 - 2012

M3 - Conference paper

SN - 978-0-9502463-6-9

VL - Volume:2

T3 - Physical Sciences: Tools and Techniques

SP - 685

EP - 686

BT - European Microscopy Congress

PB - .

T2 - European Microscopy Congress

Y2 - 16 September 2012 through 21 September 2012

ER -