Universal pressure scanning electron microscopy (UPSEM) –electron microscopy from high vacuum to atmospheric pressure

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband

Originalsprache	englisch
Titel	MC2017
Seiten	IM1.012
Publikationsstatus	Veröffentlicht - 2017
Veranstaltung	Microscopy Conference 2017: MC17 - Lausanne, Schweiz Dauer: 21 Aug. 2017 → 25 Aug. 2017 http://www.mc2017.ch/

ASJC Scopus subject areas

@inproceedings{63860188035448e19682ad989baee3a1,

title = "Universal pressure scanning electron microscopy (UPSEM) –electron microscopy from high vacuum to atmospheric pressure",

author = "Johannes Rattenberger and Tobias Achtsnit and Fitzek, {Harald Matthias} and Hartmuth Schr{\"o}ttner and Ferdinand Hofer",

year = "2017",

language = "English",

pages = "IM1.012",

booktitle = "MC2017",

note = "Microscopy Conference 2017 : MC17, MC 2017 ; Conference date: 21-08-2017 Through 25-08-2017",

url = "http://www.mc2017.ch/",

}

TY - GEN

T1 - Universal pressure scanning electron microscopy (UPSEM) –electron microscopy from high vacuum to atmospheric pressure

AU - Rattenberger, Johannes

AU - Achtsnit, Tobias

AU - Fitzek, Harald Matthias

AU - Schröttner, Hartmuth

AU - Hofer, Ferdinand

PY - 2017

Y1 - 2017

M3 - Conference paper

SP - IM1.012

BT - MC2017

T2 - Microscopy Conference 2017

Y2 - 21 August 2017 through 25 August 2017

ER -