Visual Analytics for the Big Data Era -- A Comparative Review of State-of-the-Art Commercial Systems

Leishi Zhang; Andreas Stoffel; Michael Behrisch; Sebastian Mittelstädt; Tobias Schreck; René Pompl; Stefan Weber; Holger Last; Daniel A. Keim

doi:10.1109/VAST.2012.6400554

Visual Analytics for the Big Data Era -- A Comparative Review of State-of-the-Art Commercial Systems

Leishi Zhang, Andreas Stoffel, Michael Behrisch, Sebastian Mittelstädt, Tobias Schreck, René Pompl, Stefan Weber, Holger Last, Daniel A. Keim

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Originalsprache	englisch
Titel	2012 IEEE Conference on Visual Analytics Science and Technology (VAST)
Herausgeber (Verlag)	IEEE
Seiten	173-182
ISBN (Print)	978-1-4673-4752-5
DOIs	https://doi.org/10.1109/VAST.2012.6400554
Publikationsstatus	Veröffentlicht - 2012

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10.1109/VAST.2012.6400554

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@inproceedings{aae11b9098224ed783b8df0f3e4fe2d3,

title = "Visual Analytics for the Big Data Era -- A Comparative Review of State-of-the-Art Commercial Systems",

author = "Leishi Zhang and Andreas Stoffel and Michael Behrisch and Sebastian Mittelst{\"a}dt and Tobias Schreck and Ren{\'e} Pompl and Stefan Weber and Holger Last and Keim, {Daniel A.}",

year = "2012",

doi = "10.1109/VAST.2012.6400554",

language = "English",

isbn = "978-1-4673-4752-5",

pages = "173--182",

booktitle = "2012 IEEE Conference on Visual Analytics Science and Technology (VAST)",

publisher = "IEEE",

address = "United States",

}

TY - GEN

T1 - Visual Analytics for the Big Data Era -- A Comparative Review of State-of-the-Art Commercial Systems

AU - Zhang, Leishi

AU - Stoffel, Andreas

AU - Behrisch, Michael

AU - Mittelstädt, Sebastian

AU - Schreck, Tobias

AU - Pompl, René

AU - Weber, Stefan

AU - Last, Holger

AU - Keim, Daniel A.

PY - 2012

Y1 - 2012

U2 - 10.1109/VAST.2012.6400554

DO - 10.1109/VAST.2012.6400554

M3 - Conference paper

SN - 978-1-4673-4752-5

SP - 173

EP - 182

BT - 2012 IEEE Conference on Visual Analytics Science and Technology (VAST)

PB - IEEE

ER -