Description
14th European Microscopy Congress 2008| Period | 31 Aug 2008 → 5 Sept 2008 |
|---|---|
| Event type | Conference |
| Location | Aacheb, GermanyShow on map |
| Degree of Recognition | International |
Fields of Expertise
- Advanced Materials Science
Related content
-
Publications
-
Experimental determination of the total scattering cross section of water vapour and of the effective beam gas path length in a low vacuum scanning electron microscope
Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review
-
Experimental determination of the total scattering cross section of water vapour and of the effective beam gas path length in a low vacuum scanning electron microscope.
Research output: Contribution to conference › Poster
-
DualBeam FIB application of 3D EDXS for superalloy δ-phase characterization
Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review