Electromagnetic Compatibility of Integrated Circuits – An Introduction to EMC Test Methods

Activity: Talk or presentationInvited talk at conference or symposiumScience to public

Period12 Mar 201816 Mar 2018
Event title19th IEEE Latin-American Test Symposium (LATS2018)
Event typeConference
LocationSao Paulo, BrazilShow on map
Degree of RecognitionInternational


  • EMC
  • Integrated Circuits Testing
  • Emission
  • IEC 61967
  • IEC 62132

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Fields of Expertise

  • Information, Communication & Computing