Electron diffraction techniques on the Scanning Electron Microscope

Description

The basic principles of electron diffraction methods on a scanning electron microscope (SEM) are presented. The underlying physics and crystallographic basis are briefly reviewed and the most commonly used SEM electron diffraction techniques, Electron Backscatter Diffraction (EBSD) and Electron Channeling Contrast Imaging (ECCI) including their application in material characterization are presented. Remote demo exercises on the SEM and hands on exercises on the PC complement the lecture program. The participants attain basic knowledge on SEM electron diffraction methods and competence in processing and interpreting SEM electron diffraction data

Period	3 Feb 2023
Event type	Course
Location	Vienna, AustriaShow on map
Degree of Recognition	International