IC-level ESD scheme, customization and reliability aspects

Michalowska-Forsyth, A. M. (Speaker)

Institute of Electronics (4390)

Activity: Talk or presentation › Talk at workshop, seminar or course › Science to science

Period	5 Oct 2022
Held at	CNRS Institut National de Physique Nucléaire et de Physique des Particules (IN2P3), France
Degree of Recognition	International

Keywords

IC
ESD
Radiation Hardness
Radiation effects
Reliability
CMOS Technology
Latchup

Documents & Links

IC-level ESD - Lecture Overview
File: application/pdf, 163 KB
Type: Other

https://caemi2i.in2p3.fr/index.php/2022/08/30/ecole-in2p3-nanoelectronique-2022/

Related content

Projects
FWF - Robust IC - Studies of robustness of analog integrated circuits
Project: Research project