Locating EMC problems at the surface of ICs and PCBs

Activity: Talk or presentation › Invited talk at conference or symposium › Science to public

Period13 Apr 2018
Event titleMicroelectronic Systems Symposium (MESS18)
Event typeConference
LocationWien, AustriaShow on map
Degree of RecognitionNational

Keywords

  • Surface scan
  • EMC
  • Integrated Circuit
  • IEC 61967
  • IEC 62132

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Fields of Expertise

  • Information, Communication & Computing