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Near field EM measurement techniques:abilities and limits
Pommerenke, D. J.
(Speaker)
Institute of Electronics (4390)
Activity
:
Talk or presentation
›
Invited talk
›
Science to science
Description
Describing different EMC scanning methods from EMI scanning to ESD susceptibility scanning
Period
12 Jan 2021
Held at
IEEE Electromagnetic Compatibility Society (EMC-S)
, United States
Keywords
electromagnetic compatibility
electrostatic discharge
Fields of Expertise
Information, Communication & Computing