Optical measurement systems for industrial inspection IV, SPIE International Symposium Optical Metrology

  • Thomas Thurner (Speaker)

    Activity: Talk or presentation › Talk at conference or symposium › Science to science

    Description

    Talk: Robust high precision 2d optical range sensor
    Period13 Jun 2005 → 17 Jun 2005
    Event titleOptical measurement systems for industrial inspection IV, SPIE International Symposium Optical Metrology
    Event typeConference