Small Angle X-ray Scattering for Metrology on the nm-Scale

  • Amenitsch, H. (Speaker)
  • Michele Devetta (Contributor)
  • Paolo Piseri (Contributor)

Activity: Talk or presentation › Invited talk at conference or symposium › Science to science

Period19 Sept 2017
Event titleMNE 2017: 43rd Micro Nano Engineering conference
Event typeConference
LocationBraga, PortugalShow on map
Degree of RecognitionInternational

ASJC Scopus subject areas

  • Materials Science(all)
  • Physical and Theoretical Chemistry

Fields of Expertise

  • Advanced Materials Science