Spectroscopic electron microscopy in two and three dimensions

Activity: Talk or presentationInvited talk at conference or symposiumScience to science

Description

Electron energy-loss spectroscopy (EELS) and energy-dispersive X-ray spectroscopy (EDXS) in the scanning transmission electron microscope (STEM) are powerful methods for elemental mapping at the nano- and atomic scale. In addition, EELS also provides information about chemical bonding or about optical materials properties. Usually, a TEM only gives projected 2D information about a sample, but by acquisition and reconstruction of a tomographic tilt series STEM imaging and spectroscopy can be extended to the third spatial dimension.
In this presentation, I will introduce the principles of spectroscopic STEM imaging for accessing elemental information, but also for the excitation and imaging of surface polariton fields stemming from either plasmons or optical phonons. I will show examples of surface plasmon imaging on different plasmonic materials and devices, ranging from single metallic nanoparticles to more complex multimaterial assemblies. Finally, I will discuss the combination of spectroscopy and tomography for accessing elemental composition in three dimensions, as well as for reconstruction the electromagnetic properties of surface polariton fields.
Period20 Mar 202321 Mar 2023
Event titleCRC 1411 International Symposium
Event typeConference
LocationErlangen, GermanyShow on map
Degree of RecognitionInternational

ASJC Scopus subject areas

  • General Materials Science

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)